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Contribution to Bayesian Estimation Based on Records Value
Komal Rathee , Ashish Kumar Shukla
Abstract
A family of lifetime distributions, which covers many well-known lifetime distributions as specific cases, is considered. Bayesian estimation procedures are developed for two measures of reliability, R(t) = P(X > t) and   P = P(X > Y ) based on records. Two type of loss functions namely squared error loss function (SELF) and general entropy loss function (GELF) are also considered. A new technique for obtaining the estimators of various reliability measures based on record value is proposed using Bayes estimator’s powers of parameters.
The expressions for various risk functions are derived.
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ISSN(P) 2350-0174

ISSN(O) 2456-2378

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