A. C. Kimber; H. J. Stevens; The null distribution of a test
for two upper outliers in an exponential sample, Applied Statistics, 30,
No. 2: 153–157 (1981).
A. C. Kimber; Tests for many outliers in an exponential sample, Applied Statistics, 31: 263–271 (1982).
B. K. Kale; Trimmed means and the method of maximum likelihood
when spurious observations are present, Applied Statistics, R. P.
Gupta, Ed., North Holland, Amsterdam, 177–185 (1975).
B. K. Kale; Modified failure time distributions to accommodate
instantaneous and early failures, Industrial Mathematics and
Statistics, Ed. J. C. Misra, Narosa Publishing House, New Delhi, 623–648
(2003).
B. K. Kale; K. Muralidharan; Optimal estimating equations in
mixture distributions accommodating instantaneous or early failures,
Journal of the Indian Statistical Association, 38: 317–329 (2000).
B. K. Kale; K. Muralidharan; Masking effect of inliers, Journal of the Indian Statistical Association, 45(1): 33–49 (2007).
B. K. Kale; K. Muralidharan; Maximum Likelihood estimation in
presence of inliers, Journal of Indian Society for Probability and
Statistics, 10: 65–80 (2008).
B. Rosner; On the detection of many outliers, Technometrics, 17(2): 221–227 (1975).
C. Lin; N. Balakrishnan; Exact computation of the null
distribution of a test for multiple outliers in an exponential sample,
Computational Statistics & Data Analysis, 53(9): 3281–3290 (2009).
C. Lin; N. Balakrishnan; Tests for Multiple Outliers in an
Exponential Sample, Communications in Statistics–Simulation and
Computation, 43(4): 706–722 (2014).
D. M. Hawkins; Identification of outliers, Chapman and Hall, London (1980).
F. Louzada; P. L. Ramos; P. H. Ferreira; Exponential-Poisson
distribution: estimation and applications to rainfall and aircraft data
with zero occurrence, Communication in Statistics–Simulation and
Computation, 46(10), 8118-8139 (2017).
G. Bipin; D. Mintu; Detection of Multiple Upper Outliers in
Exponential Sample under Slippage Alternative, International Advanced
Research Journal in Science, Engineering and Technology, 2(8): 63–69
(2015).
http://hydro.imd.gov.in/hydrometweb/(S(puzbfiyiec4n0p45dmrgzv45))/PRODUCTS/Publications/Rainfall%20Statistics%20of%20India%20%202016/Rainfall%20Statistics%20of%20India%20-%202016.pdf
https://rbi.org.in/Scripts/NEFTView.aspx
I. Guttman; Care and handling of univariate multivariate
outliers in detecting spuriousity- a Bayesian approach, Technometrics,
15: 723–738 (1973).
J. Aitchison; On the distribution of a positive random
variable having a discrete probability mass at the origin, Journal of
American Statistical Association, 50: 901–908 (1955).
J. R. Veale; Improved estimation of expected life when one
identified spurious observation may be present, Journal of American
Statistical Association, 70: 398–401 (1975).
J. W. Tukey; A survey of sampling from contaminated
distributions. In Contributions to Probability and Statistics: Essays in
Honor of Harold Hotelling (I. Olkin, S. G. Ghurye, W. Hoeffding, W. G.
Madow and H. B. Mann, eds.), Stanford Univ. Press, 448–485 (1960).
J. Zhang; Tests for multiple upper or lower outliers in an
exponential sample, Journal of Applied Statistics, 1998, 25(2): 245–255
(1998).
K. Muralidharan; Inlier prone models: A review, ProbStat Forum, 3: 38–51 (2010).
K. Muralidharan; M. Arti; Analysis of instantaneous and early
failures in Pareto distribution, Journal of Statistical Theory and
Applications, 7:187–204 (2008).
K. Muralidharan; P. Bavagosai; Some inferential studies on
inliers in Gompertz distribution, Journal of Indian Society for
Probability and Statistics, 17: 35–55 (2016a).
K. Muralidharan; P. Bavagosai; A revisit to early failure
analysis in life testing. Journal of the Indian Statistical Association,
54(1 & 2): 43–69 (2016b).
K. Muralidharan; P. Bavagosai; Analysis of lifetime model with
discrete mass at zero and one, Journal of Statistical Theory Practice,
11(4), 670–692 (2017).
K. Muralidharan; P. Bavagosai; A new Weibull model with
inliers at zero and one based on type-II censored samples, Journal of
Indian Society of Probability and Statistics, 19: 121–151 (2018).
K. Muralidharan; P. Lathika; (2004) The concept of inliers,
Proceeding of first Sino-International Symposium on Probability,
Statistics and Quantitative Management, Taiwan, October, 77–92.
K. Muralidharan; P. Lathika; Analysis of instantaneous and
early failures in Weibull distribution, Metrika, 64(3): 305–316 (2006).
K. Muralidharan; P. Lathika; Statistical modeling of rainfall
data using modified Weibull distribution, Mausam, Indian Journal of
Meteorology, Hydrology and Geophysics, 56(4): 765–770 (2005).
K. Vannman; Comparing samples from nonstandard mixtures of
distributions with applications to quality comparison of wood; Research
report: 2, submitted to the division of quality technology, Lulea
University, Lulea, Sweden (1991).
K. Vannman; (1995). On the distribution of the estimated mean
from the nonstandard mixtures of distribution, Communication in
Statistics–Theory and Methods, 24(6): 1569–1584 (1995).
M. S. Chikkagoudar; S. H. Kunchur; Distribution of test
statistics for multiple outliers in exponential samples, Communication
in Statistics–Theory and Methods, 12: 2127–2142 (1983).
M. S. Chikkagoudar; S. H. Kunchur; Comparison of many outlier
procedures for exponential samples, Communication in Statistics–Theory
and Methods, 16: 627–645 (1987).
P. Bavagosai; K. Muralidharan; Some inferential study on
inliers in Lindley distribution, International Journal of Statistics and
Reliability Engineering, 3(2): 108–129 (2016).
R. L. Shinde; A. Shanubhogue; Estimation of parameters and the
mean life of a mixed failure time distribution, Communication in
Statistics–Theory and Methods, 29(1): 2621–2642 (2000).
S. M. Bendre; B. K. Kale; Masking effect on test for outliers
in exponential models, Journal of the American Statistical Association,
80 (392): 1020–1025 (1985).
T. Lewis; N. R. J. Feller; A recursive algorithm for null
distributions for outliers: I. Gamma sample, Technometrics, 21: 371–376
(1979).
T. S. Ferguson; Rules of rejection of outliers, Revue Institute Internationale de Statistica, 29(3): 29–43 (1961).
U. Balasooriya; V. Gadag; Test for upper outliers in the
two-parameter exponential distribution, Journal of Statistical
Computation and Simulation, 50, 3–4: 249–259 (1994).
V. Barnett; T. Lewis; Outliers in Statistical Data, 3rd ed., John Wiley& Sons, New York (1994).
V. P. Jayade; M. S. Prasad; Estimation of parameters of mixed
failure time distribution, Communication in Statistics–Theory and
Methods, 19(12): 4667–4677 (1990).
W. G. Cochran; The distribution of the largest of a set of
estimated variances as a fraction of their total, Annals of Eugenics,
11, 47–52 (1941).
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